Physical Properties
| Property | Value |
|---|---|
| V(λ) Reflectance | 58.45% |
| M(λ) Reflectance | 48.13% |
| M/P Ratio | 0.82 |
| L* | 80.79 |
| a* | -1.84 |
| b* | 14.36 |
| Rreflectance | 63.19% |
| Greflectance | 58.18% |
| Breflectance | 42.24% |
| Specularity | 0.00% |
| Roughness | 0.00 |
Radiance Definition
void plastic munsell_25y_82
0
0
5 0.6319 0.5818 0.4224 0.0000 0.0000
Radiance 6 Spectral Definition
void spectrum _diffuseSpectrum*
0
0
33 400 700
0.5803 0.7192 0.7279 0.7238 0.7224 0.7132
0.7116 0.7140 0.7150 0.7097 0.7230 0.7938
0.8897 0.9339 0.9466 0.9682 0.9936 1.0000
0.9921 0.9931 0.9896 0.9826 0.9765 0.9781
0.9674 0.9600 0.9526 0.9439 0.9315 0.9317
0.9201
_diffuseSpectrum* plastic munsell_2.5y_8_2
0
0
5 0.6221 0.6221 0.6221 0 0.0000
Download Data
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Rendering Sample
Metadata
Measurement device Spectrophotometer
Surface type Color Swatch
Location Raleigh, NC, USA
Measured by Mike Vrhel
Method Spectrophotometer
Comment Measurements originally contributed by Mike Vrhel at NCSU. The measurement is of the reflectance spectra of 1/64 Munsell chips. These outputs are parsed from the MGF file available at http://radsite.lbl.gov/mgf/mat/ncsu.tar.Z.