The Spectral Materials Database is maintained by J. Alstan Jakubiec, assistant professor at the University of Toronto and the head of the Design for Climate & Comfort Lab. It currently contains 1,204 measurements of opaque materials recorded using various spectrally-specific spectrophotmeter sensing devices; therefore, it contains accurate color and reflection information for a variety of realistic surfaces which can be used for lighting simulations in tools such as Radiance, Lark, and ALFA.
Beyond this website, all of our material reflectance data is publicly available on our GitHub.
If you use the database in a piece of scholarly work, you may cite our PLEA paper:
Many people have contributed to the measurements and development of the database. Nathaniel Jones very kindly shared his measurements as well as his methods for estimating roughness. Jon Sargent and Solemma provided the geometry used in rendering material previews. Xiaoming Yang and German Molina pointed out an error with specularity in an earlier version way back in 2017. In addition, so many have contributed measurements directly or indirectly. They are listed in alphabetical order here: Priji Balakrishnan, Caroline, Andrew Glassner, Kate Kazimowicz, Zhe Kong, Lee Hui Ling Alexandra, Timothy Lum, Kevin Josiah Neo, Geraldine Quek, Thanyalak Srisamranrungruang, Mike Vrhel, Greg Ward, and Matthew Wong. I apologize if I have forgotten anyone.
All measurements in the database are correct in as far as the author is aware; however, if you find an error, please contact me. Photopic (V(λ)) reflectance values are reported according to the 1924 CIE 2° obsever. Melanopic (M(λ)) reflectance values are reported according to Lucas et al. Radiance material roughness values are provided for all materials in the database based on the estimation techniques used by Nathaniel Jones and Christoph Reinhart in Experimental validation of ray tracing as a means of image-based visual discomfort prediction: